Recently, NI (National Instruments Corporation of the United States), the world’s well-known test and measurement equipment manufacturer, officially released the latest work on its PXI Express platform – PXIE-5172 high-speed oscilloscope, model 784224-01. The advent of this high-performance oscilloscope not only marks NI’s technical strength in the field of high-speed signal testing, but also provides a more powerful and flexible test tool for engineers and researchers.
The PXIE-5172 PXI Express high-speed oscilloscope has attracted extensive attention in the industry with its excellent performance parameters and wide application scenarios. The oscilloscope supports bandwidth up to 2 GHz, enabling accurate capture and analysis of complex high-speed signals at high sampling rates. At the same time, its deep memory and high-speed data stream processing capabilities ensure long-term, continuous signal monitoring and data recording, providing abundant data support for scientific researchers.
“The release of the PXIE-5172 PXI Express high-speed oscilloscope is a testament to our continued investment and innovation in high-speed signal testing.” “We are committed to providing our customers with the most advanced and reliable test and measurement solutions to help them improve efficiency and reduce costs during development, validation and production,” said NI’s product manager in a press release.
The design of PXIE-5172 oscilloscope fully considers the actual needs and experience of users. It supports multiple trigger modes and advanced analysis features such as fast Fourier transform (FFT), histogram statistics, waveform mathematics, etc., making it easy for users to perform signal analysis, fault diagnosis, and performance evaluation. In addition, the oscilloscope is highly customizable and scalable, and can be seamlessly integrated with other PXI Express modules to build systems that meet complex test needs.
In terms of application fields, the PXIE-5172 PXI Express high-speed oscilloscope is widely used in many industries such as communications, semiconductors, automotive electronics, and aerospace. In the field of communication, it can be used for high-speed digital signal analysis, optical fiber communication testing, etc. In the semiconductor field, it can be used for chip verification, signal integrity testing, etc. In the field of automotive electronics, it can be used for automotive bus analysis, sensor testing, etc.
“We are confident in the market prospects of the PXIE-5172 PXI Express high-speed oscilloscope.” “We believe that with its superior performance and wide range of application scenarios, this product will become an indispensable test tool for engineers and researchers, driving technological progress and development in all industries,” said NI’s Director of Marketing.
With the official release and gradual popularization of the PXIE-5172 PXI Express high-speed oscilloscope, we have reason to believe that it will set off a new wave of technology in the field of test and measurement, and inject new vitality into scientific and technological innovation and industrial development.