The PXIe-5186 from National Instruments (NI) is a high-performance PXI oscilloscope designed for applications that require accurate measurement and fast signal capture. It has an analog bandwidth of 5 GHz and a sampling rate of 12.5 GS/s, which makes it ideal for the digitization and analysis of high-speed signals. The oscilloscope has two voltage input channels, supports input impedance of 50 Ω and 1 MΩ, and offers flexible coupling, voltage range, and filtering options. In addition, the PXIe-5186 features multiple trigger modes, deep onboard memory, and data streaming and analysis capabilities, making it widely used in semiconductor device testing, aerospace component testing, consumer electronics testing, medical imaging, scientific research, and military/aerospace applications.
In addition, the oscilloscope also supports PXI synchronization and data streaming capabilities, which allows it to play a key role in complex test and measurement systems that require synchronization of multiple instruments.
In terms of technical specifications, the PXIe-5186 offers a variety of features, including but not limited to:
Maximum bandwidth: 5 GHz
Maximum sampling rate: 12.5GS /s
Voltage input channels: 2, support simultaneous sampling
Analog input resolution: 8 bits
Onboard memory: 16 MB or 512 MB
Supported trigger types: Edge trigger, digital trigger, immediate trigger, and software trigger
Time resolution: 3 picoseconds when on time to Digital conversion circuit (TDC), 2.56 nanoseconds when off
Power requirements: + 3.3VDC 5.1A, + 12VDC 6.1A, +5 Vaux 12 mA, total power 90 W
Software support: NI-SCOPE 3.9.6 or later, compatible with multiple development environments, including LabVIEW, LabWindows/CVI, Measurement Studio, Microsoft Visual C/C++, and Microsoft Visual Basic.
These characteristics of the PXIe-5186 make it an ideal choice for engineers and researchers when conducting high-speed signal measurement and analysis.