The PXIe-5160 from National Instruments is a high-performance PXI Express oscilloscope designed for applications requiring high-speed signal testing. The device is available in two models, two channels (PXIe-5160 (2 CH)) and four channels (PXIe-5160 (4 CH)), and all channels can achieve synchronous sampling, ensuring the consistency and accuracy of measurement data. With an analog bandwidth of up to 500 MHz and a sampling rate of up to 2.5 GS/s, the oscilloscope can capture rapidly changing signals, making it ideal for high-speed signal testing and analysis.

The PXIe-5160 oscilloscope has flexible coupling, voltage range and filter Settings, supporting AC (AC) or DC (DC) coupling mode, and input impedance can be selected between 50 Ω or 1 MΩ through software to adapt to different test requirements. The oscilloscope also has a high capacity onboard memory with a storage depth of 64 MB or 2 GB, allowing for long time recording and in-depth analysis of signals. In addition, the PXIe-5160 also supports multiple trigger modes, including edge trigger, digital trigger, immediate trigger and delayed trigger, as well as high-precision trigger circuits and PXI synchronization, ensuring flexibility and accuracy of testing.

PXIe-5160

Some models of the PXIe-5160 also support CableSense™ technology, which can detect and locate faults, changes or discontinuities in the signal path, further improving test reliability. In terms of software, the PXIe-5160 supports NI-SCOPE IVI compatible drivers, It can be used in LabVIEW, LabWindows™/CVI™, Measurement Studio, Microsoft Visual C/C++ and.NET (C# and VB.NET) development environments, providing rich software support and convenient operation experience.

The physical characteristics of the PXIe-5160 oscilloscope include a height of 3U and a width of 1 slot, with dimensions of 21.4cm × 2.0cm × 13.1cm (8.4 in. × 0.8 in. × 5.1 in.) and a weight of approximately 430 g (15 oz.). It can operate in the temperature range from 0 °C to 45 °C, store in the temperature range from -40 °C to 71 °C, and is suitable for a variety of environmental conditions. Whether in research and development testing, manufacturing and quality control, or high-end applications such as aerospace, automotive electronics, semiconductor testing, the PXIe-5160 provides powerful test and measurement capabilities, making it the ideal choice for engineers and researchers.