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Description
PXIe-6674T PXI Express synchronization module
Product Description
The PXIe-6674T is a PXI Express synchronization module manufactured by National Instruments that creates and sets clocks and trigger signals between the PXI Express chassis and other PXI and PXI Express chassis or external instruments. Here are some of the key features and application areas of the product:
Product number: 781037-01, 199223G-01L, 199225D-01.
Functions: Generate and route clock signals, support the PXIe-DStarA, PXIe-DStarB, and PXIe-DStarC trigger buses via PXI Express’s Advanced Low Voltage Differential Signaling (LVDS), and fully support the PXI trigger line.
Clock signals: Ability to create depth-stabilized 10 MHz clocks based on internal precision compensated glass oscillator (OCXO) benchmarks, as well as direct digital synthetic clocks (DDS) up to 1 GHz from power generation circuits.
Applications: Suitable for test and measurement systems that require accurate clock and trigger signal synchronization, including defense and aerospace, automotive, component testing, etc.
Programming and control: Users can use NI application software such as LabVIEW or LabWindows/CVI for programming control, or other development environments such as Visual C/C++.
Hardware features: Including but not limited to OCXO clock outputs, CLKIN inputs, CLKOUT outputs, PFI and LVDS programmable function interfaces, and PXI trigger and star trigger buses.
Electromagnetic Compatibility: This hardware has been tested to comply with applicable Electromagnetic compatibility (EMC) regulations and limitations, and is accompanied by the corresponding Declaration of Conformity (DoC).
Warranty Policy: NI offers a one-year limited warranty for hardware products, a 90-day limited warranty for software products, and a repair, replacement, or refund service if the product fails during the warranty period.
PXIe-6674T
Product parameter
Product model: PXIe-6674T
Function: Generate and route clock signals and trigger signals.
Clock signal type:
Highly stable 10 MHz clock based on internal precision compensated glass oscillator (OCXO).
Direct Digital Synthesis (DDS) clocks with frequencies up to 1 GHz.
Trigger bus support: PXIe-DStarA, PXIe-DStarB, and PXIe-DStarC, fully compatible with PXI trigger lines.
Interface type:
The front panel provides CLKIN (AC coupled, 50 Ω clock input) and CLKOUT (AC coupled clock output) interfaces.
Programmable function interface (PFI) for single-ended or LVDS operation.
Clock generation capability: The ability to generate clock signals from sub-1 Hz to 1 GHz with very fine frequency resolution.
Synchronization capability: Supports synchronization of multiple devices in a multi-chassis PXI Express system.
Electromagnetic compatibility: In line with EMC regulations, the design has anti-interference ability.
Operating temperature range: usually 0°C to 45°C.
Power requirements: It depends on the power supply capability of the PXI Express chassis.
Size: Conforming to the standard size of PXI Express modules, suitable for installation in PXI Express chassis.
Warranty: One year limited warranty from National Instruments.
Application field
Automated test system: product quality inspection and performance testing on the production line.
Aerospace and Defense: Used to test and validate electronics in aircraft, satellites and missile systems.
Automotive testing: Engine control units, sensors and on-board networks are tested during automotive development.
Semiconductor testing: Used for semiconductor chip testing, including performance testing, reliability testing, etc.
Research experiments: Basic scientific research and the development of new technologies are carried out in universities and research institutes.
Industrial automation: Synchronizing multiple devices and sensors in an automated control system.
Communication systems: Simultaneous data acquisition and signal processing in the development and testing of wireless communication devices.
Power system testing: In the testing of power equipment and systems, ensure signal synchronization and system stability.
Medical device testing: Testing equipment performance and safety in the development and quality control of medical devices.
Environmental monitoring: Synchronize sensors and data acquisition systems in environmental monitoring equipment.
Data recording systems: In data recording applications where high precision time stamps are required.
Distributed systems: In distributed systems where multiple remote nodes or devices need to be synchronized.
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